Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization
نویسندگان
چکیده
منابع مشابه
Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.
This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
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ژورنال
عنوان ژورنال: Applied Spectroscopy
سال: 2013
ISSN: 0003-7028,1943-3530
DOI: 10.1366/12-06883